Robust Computing with Nano-scale Devices: Progresses and Challenges
Author:   Chao Huang
Publisher:   Springer
Edition:   2010 ed.
Volume:   58
ISBN:  

9789400731837


Pages:   180
Publication Date:   05 May 2012
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Robust Computing with Nano-scale Devices: Progresses and Challenges


Overview

Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

Full Product Details

Author:   Chao Huang
Publisher:   Springer
Imprint:   Springer
Edition:   2010 ed.
Volume:   58
Dimensions:   Width: 15.50cm , Height: 1.00cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9789400731837


ISBN 10:   9400731833
Pages:   180
Publication Date:   05 May 2012
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Fault Tolerant Nanocomputing.- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics.- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays.- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics.- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight.- Computing with Nanowires: A Self Assembled Neuromorphic Architecture.- Computational Opportunities and CAD for Nanotechnologies.

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