RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
Author:   Jianjun Gao
Publisher:   Scitech
ISBN:  

9781299640689


Pages:   351
Publication Date:   01 January 2010
Format:   Electronic book text
Availability:   Available To Order   Availability explained
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RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors


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Overview

This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based.

Full Product Details

Author:   Jianjun Gao
Publisher:   Scitech
Imprint:   Scitech
ISBN:  

9781299640689


ISBN 10:   1299640680
Pages:   351
Publication Date:   01 January 2010
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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