Residual Stresses III: Science and Technology, Volume 2

Author:   H Fujiwara ,  T Abe ,  K Tanaka
Publisher:   Taylor & Francis Group
ISBN:  

9781280049095


Pages:   1673
Publication Date:   01 January 1992
Format:   Electronic book text
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Our Price $2904.00 Quantity:  
Add to Cart

Share |

Residual Stresses III: Science and Technology, Volume 2


Overview

This volume consists of papers presented at the Third International Conference on Residual Stresses held in Tokushima, Japan, 23-26 July 1991. Approximately 330 participants from 26 countries discussed residual stresses on various aspects and 249 papers were presented. This series of conferences deals with all angles of residual and internal stresses. The conference also commemorated the 40th anniversary of the Society of Materials Science, Japan. The range of materials at the conference covered eleven organized sessions. Residual stresses have been known for a long time, but it is still highly researched in the engineering field because new problems challenge us every year. Problems arise not only in traditional materials for machinery, but also in new materials such as advanced composites and biomaterials. No matter how or what kind of materials we process, residual stresses always exist in products.; Their reliability depends on residual stresses, and because new materials are continuously being developed, residual stresses will continue to challenge us. The papers presented at the conference include all aspects of internal and residual stresses in composites ceramics, thin films and other advanced materials. Modelling and measurement of residual stresses with engineering utilization of residual stresses, are comprehensively treated. Important features are: recent experimental methods to measure residual stresses; theoretical and computational methods to evaluate residual stresses and data base for residual stresses in modern technology. This book should be of interest to scientists and engineers, especially designers and process-engineers working in the fields related to residual and international stresses.

Full Product Details

Author:   H Fujiwara ,  T Abe ,  K Tanaka
Publisher:   Taylor & Francis Group
Imprint:   Taylor & Francis Group
ISBN:  

9781280049095


ISBN 10:   128004909
Pages:   1673
Publication Date:   01 January 1992
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Countries Available

All regions
Latest Reading Guide

NOV RG 20252

 

Shopping Cart
Your cart is empty
Shopping cart
Mailing List