Reliability of Microtechnology: Interconnects, Devices and Systems
Author:   Johan Liu ,  Olli Salmela ,  Jussi Sarkka ,  James E. Morris
Publisher:   Springer-Verlag New York Inc.
Edition:   2011 ed.
ISBN:  

9781441957597


Pages:   204
Publication Date:   14 February 2011
Format:   Hardback
Availability:   In Print   Availability explained
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Reliability of Microtechnology: Interconnects, Devices and Systems


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Overview

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also includes exercises and detailed solutions at the end of each chapter.

Full Product Details

Author:   Johan Liu ,  Olli Salmela ,  Jussi Sarkka ,  James E. Morris
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2011 ed.
Dimensions:   Width: 15.50cm , Height: 1.40cm , Length: 23.50cm
Weight:   1.080kg
ISBN:  

9781441957597


ISBN 10:   1441957596
Pages:   204
Publication Date:   14 February 2011
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Introduction to Reliability and its Importance.- Reliability Metrology.- General Failure Mechanisms of Microsystems.- Solder and Conductive Adhesive Joint Reliability.- Accelerated Testing.- Reliability Design for Manufacturability.- Component Reliability.- System Level Reliability.- Reliability and Quality Management of Microsystem.- Experimental Tools for Reliability Analysis.

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