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OverviewFull Product DetailsAuthor: Titu Bajenescu , Marius BazuPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Edition: illustrated edition ISBN: 9783540657224ISBN 10: 3540657223 Pages: 550 Publication Date: April 1999 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsIntroduction; State of the Art in Reliability; Reliability of passive electronic parts; Reliability of Diodes; Reliability of Silicon Transistors; Reliability of Thyristors; Reliability of Integrated Circuits; Reliability of Hybrids; Reliability of Memories; Reliability of Optoelectronics; Noise and Reliability; Plastic Package and Reliability; Test and Testability of Logic ICs; Failure Analysis; Appendix.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |