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OverviewThis unique volume presents chapters written on the areas of life-testing and reliability by many well-known researchers who have contributed significantly to these two areas over the years. Chapters cover a wide range of topics such as inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, accelerated testing, and more. The book is written in an easy-to-follow style, first presenting the necessary theoretical details and then illustrating the methods with a numerical examples wherever possible. Many tables and graphs that are essential for the use of some of the new methodologies are presented throughout the volume. Numerous examples provide the reader with a clear understanding of the methods presented as well as with insight into the applications of these results. Full Product DetailsAuthor: N. Balakrishnan (McMaster University, Hamilton, Ontario, Canada) , H. Leon Harter , Jon E. Anderson , Ananda Sen (Oakland University)Publisher: Taylor & Francis Inc Imprint: CRC Press Inc Dimensions: Width: 17.40cm , Height: 3.40cm , Length: 24.60cm Weight: 1.400kg ISBN: 9780849389726ISBN 10: 0849389720 Pages: 672 Publication Date: 27 April 1995 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationBalakrishnan\, N. Tab Content 6Author Website:Countries AvailableAll regions |