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OverviewThis book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide. Full Product DetailsAuthor: M. T. Sebastian , P. KrishnaPublisher: Gordon & Breach Science Publishers SA Imprint: Gordon & Breach Science Publishers SA Weight: 0.861kg ISBN: 9782881249259ISBN 10: 2881249256 Pages: 400 Publication Date: 31 March 1994 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Temporarily unavailable The supplier advises that this item is temporarily unavailable. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out to you. Table of ContentsStacking faults in close-packed structures; diffuse X-ray scattering from randomly faulted close-packed structures; non-random faulting in close-packed structures; periodic faulting in crystals - polytypism.ReviewsAuthor InformationSebastian, M. T.; Krishna, P. Tab Content 6Author Website:Countries AvailableAll regions |
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