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OverviewFull Product DetailsAuthor: V. S. VavilovPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of the original 1st ed. 1977 Dimensions: Width: 14.00cm , Height: 1.50cm , Length: 21.60cm Weight: 0.364kg ISBN: 9781468490718ISBN 10: 1468490710 Pages: 280 Publication Date: 26 November 2012 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of Contentsone.- I The Theory of the Formation and Nature of Radiation-Induced Defects.- II Experimental Study of Radiation Defects in Semiconductors and Control of Semiconductor Properties by Irradiation.- III Ionization in Semiconductors as a Result of the Stopping of Charged Particles, Absorption and Scattering of Photons.- Two.- I Radiation Effects in Transistors.- II Radiation Effects in Semiconductor Diodes.- III Effect of Pulsed Radiation on Semiconductor Devices.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |