Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements
Author:   Jan Iwanczyk (DxRay Inc., USA.) ,  Krzysztof Iniewski
Publisher:   Taylor & Francis Ltd
Edition:   2nd edition
ISBN:  

9780367707170


Pages:   323
Publication Date:   27 May 2024
Format:   Paperback
Availability:   In Print   Availability explained
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Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements


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Author:   Jan Iwanczyk (DxRay Inc., USA.) ,  Krzysztof Iniewski
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Edition:   2nd edition
Weight:   0.453kg
ISBN:  

9780367707170


ISBN 10:   0367707179
Pages:   323
Publication Date:   27 May 2024
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Jan Iwanczyk is a consultant to Universities and private companies since July 2017. He has served as a President and CEO of DxRay, Inc., Northridge, California, from 2005 to 2017. Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications.

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