Full Product Details
Author: Ron Jenkins ,
R. W. Gould ,
Dale Gedcke ,
Dale Gedcke (EG&G ORTEC, Oak Ridge, Tennessee, USA)
Publisher: Taylor & Francis Inc
Imprint: CRC Press Inc
Edition: 2nd edition
Volume: v. 20
Dimensions:
Width: 15.60cm
, Height: 2.90cm
, Length: 23.40cm
Weight: 0.839kg
ISBN: 9780824795542
ISBN 10: 0824795547
Pages: 504
Publication Date: 26 April 1995
Audience:
College/higher education
,
Professional and scholarly
,
Postgraduate, Research & Scholarly
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: In Print
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Reviews
International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book. ---Analytical Chemistry . . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis. ---Journal of Applied Crystallography Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field. ---Journal of Analytical Atomic Spectrometry
""International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book. "" ---Analytical Chemistry "". . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis. "" ---Journal of Applied Crystallography ""Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field. "" ---Journal of Analytical Atomic Spectrometry
"""International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book. "" ---Analytical Chemistry "". . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis. "" ---Journal of Applied Crystallography ""Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field. "" ---Journal of Analytical Atomic Spectrometry"
