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OverviewThis volume provides coverage of the field of quantitative beam analysis. It covers the latest techniques for the determination of chemical composition based on the analysis of emitted radiations obtained from the bombardment of micrometre and submicrometre areas of solids with ions, electrons, X-rays and laser beams. Both practical and theoretical aspects of the subject are covered in detail. The contributors cover such topics as surface analytical techniques of Auger electron spectroscopy, X-ray photoelectron spectroscopy and secondary ion mass spectroscopy, as well as accelerated ion beam analysis techniques. Emphasis is placed on the comparison of the various techniques and the use of computer programs in the analysis of results. Full Product DetailsAuthor: A.G Fitzgerald , B.E Storey (University of Dundee, UK) , D.J Fabian (University of Dundee, UK) , P. OsbornePublisher: Taylor & Francis Ltd Imprint: Institute of Physics Publishing Volume: 40 Dimensions: Width: 15.60cm , Height: 2.60cm , Length: 23.40cm Weight: 0.952kg ISBN: 9780750302562ISBN 10: 0750302569 Pages: 350 Publication Date: 01 January 1993 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationA.G Fitzgerald Tab Content 6Author Website:Countries AvailableAll regions |