Quality and Reliability Management and Its Applications

Author:   Hoang Pham
Publisher:   Springer London Ltd
Edition:   1st ed. 2016
ISBN:  

9781447167761


Pages:   451
Publication Date:   01 December 2015
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Quality and Reliability Management and Its Applications


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Author:   Hoang Pham
Publisher:   Springer London Ltd
Imprint:   Springer London Ltd
Edition:   1st ed. 2016
Dimensions:   Width: 15.50cm , Height: 2.50cm , Length: 23.50cm
Weight:   8.276kg
ISBN:  

9781447167761


ISBN 10:   1447167767
Pages:   451
Publication Date:   01 December 2015
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Dr. Hoang Pham is Professor and Chair of the Department of Industrial and Systems Engineering at Rutgers University, New Jersey. Before joining Rutgers, he was a senior engineering specialist at the Boeing Company, Seattle and the Idaho National Engineering Laboratory, Idaho Falls. His research interests include system reliability modeling, maintenance, software reliability, probabilistic risk assessment, reliability management, and environmental risk assessment. Dr. Pham is the author of 6 books and has edited over ten books including Handbook of Reliability Engineering (Springer-Verlag, 2003) and Springer Handbook of Engineering Statistics (Springer, 2006). He is the editor of Springer Series in Reliability Engineering and has published more than 120 journal articles, 35 book chapters, and over 50 conference papers. Dr. Pham is the editor-in-chief of the International Journal of Reliability, Quality and Safety Engineering, and also serves as associate editor of five journals including the IEEE Trans. on Systems, Man and Cybernetics - Part A. He has been conference chair and program chair of over 35 international conferences and is currently the Conference Chair of the 18th International Conference on Reliability and Quality in Design, Boston, MA. He is a fellow of both the IEEE and IIE. Dr. Pham received the B.S. degree in mathematics, B.S. degree in computer science, both with high honors, from Northeastern Illinois University, Chicago, the M.S. degree in statistics from the University of Illinois at Urbana-Champaign, and the M.S. and Ph.D. degrees in industrial engineering from the State University of New York at Buffalo.

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