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OverviewFull Product DetailsAuthor: John W. Evans , Jillian Y. EvansPublisher: Springer London Ltd Imprint: Springer London Ltd Edition: 2001 ed. Dimensions: Width: 15.50cm , Height: 2.30cm , Length: 23.50cm Weight: 1.680kg ISBN: 9781852332150ISBN 10: 1852332158 Pages: 402 Publication Date: 28 February 2001 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsI: Concepts.- 1. Introduction to Product Integrity and Reliability Assessment.- 2. Elements of Probability for Reliability Assessment.- 3. Concepts in Reliability for Design Jillian.- II: Failure Mechanics.- 4. Overstress Failure and Load — Strength Interference.- 5. Elements of Fatigue and Related Mechanisms.- 6. Applications of Finite Element Analysis and Whole Field Stress Measurement.- 7. Elements of Corrosion.- 8. Failures in Electronic Assemblies and Devices.- 9. Case Studies in Product Failure and Failure Analysis.- III: Testing and Failure Analysis.- 10. Introduction to Testing and Test Effectiveness for Reliability Assessment.- 11. Design and Analysis of Statistical Experiments.- 12. Accelerated Testing and Data Analysis.- 13. Failure Analysis of Assemblies and Devices.- 14. Case Studies in Product Development and Improvement.- Appendices.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |