Product Design and Testing for DOE for Automotive Engineering Volume II

Author:   Young J Chiang
Publisher:   SAE International
ISBN:  

9781468607703


Pages:   396
Publication Date:   17 September 2024
Format:   Hardback
Availability:   Available To Order   Availability explained
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Product Design and Testing for DOE for Automotive Engineering Volume II


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Overview

Explore Product Design and Testing for Automotive Engineering: Volume II, an essential guide reshaping vehicle manufacturing with unprecedented reliability. As part of SAE International's DOE for Product Reliability Growth series, this practical resource introduces cutting-edge methodologies crucial for predicting and improving product reliability in an era of automotive electrification. The book navigates statistical tolerance design, showcasing how variability in part fabrication and assembly can enhance reliability and sustainability. Key topics include: - Statistical tolerance design's impact on manufacturing and material selection, focusing on non-normal distributions' effects on product assembly and cost. Methods like maximum likelihood estimators and Monte Carlo simulations are used for assembly strategy synthesis. - Reliability DOEs using log-location-scale distributions to estimate lifetimes of non-normally distributed components, especially in accelerated life testing. It covers transformations optimizing parts and system designs under the lognormal distribution. - Weibull distribution (DOE-W) for characterizing lifetimes affected by various failure modes, detailing parameter assessment methods and real-world applications. The book also introduces reliability design of experiments based on the exponential distribution (DOE-E). - Importance of predicting lifecycles and enhancing reliability through qualitative and stepwise accelerated life tests. Integration of physics of failure with statistical methods like Weibull statistics and lognormal approximation enhances analysis credibility. - Inferential mechanisms such as the Arrhenius and Eyring models in predicting automotive component lifecycles, refining product life prediction based on reliability DOEs. Whether you're an engineer, researcher, or automotive professional, this book equips you to navigate reliability engineering confidently. Revolutionize your approach to product design and testing with Product Design and Testing for Automotive Engineering, your definitive companion in shaping the future of automotive reliability.

Full Product Details

Author:   Young J Chiang
Publisher:   SAE International
Imprint:   SAE International
Dimensions:   Width: 20.30cm , Height: 3.00cm , Length: 25.40cm
Weight:   1.302kg
ISBN:  

9781468607703


ISBN 10:   1468607707
Pages:   396
Publication Date:   17 September 2024
Audience:   General/trade ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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Young J. Chiang earned his PhD degree in 1983 (Department of Engineering Mechanics, University of Wisconsin-Madison). He has 30 years of engineering and management experiences with product R&D, CAE, design, reliability, quality, manufacturing, and program management in the US automotive industry, including Uniroyal (Michelin), Cummins, Magna, Edscha, Danaher, CTS, Coda, and Chrysler. Dr. Chiang was a member of ASME and SAE. After retiring from the US automotive industry, he worked as the vice director of Weichai Power Research Center (Shandong, China) and founded Weichai Institute of Reliability Research. He was also named the vice director of China Key State Laboratory of Engine Reliability and the executive commissioner on Reliability Committee, Chinese Mechanical Engineering Society.

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