Probing the Electronic Properties of Atomically Thin Graphitic Layers with Optical Spectroscopy.
Author:   Kin Fai Mak
Publisher:   Proquest, Umi Dissertation Publishing
ISBN:  

9781243841698


Pages:   168
Publication Date:   01 September 2011
Format:   Paperback
Availability:   Temporarily unavailable   Availability explained
The supplier advises that this item is temporarily unavailable. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out to you.

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Probing the Electronic Properties of Atomically Thin Graphitic Layers with Optical Spectroscopy.


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Author:   Kin Fai Mak
Publisher:   Proquest, Umi Dissertation Publishing
Imprint:   Proquest, Umi Dissertation Publishing
Dimensions:   Width: 18.90cm , Height: 0.90cm , Length: 24.60cm
Weight:   0.313kg
ISBN:  

9781243841698


ISBN 10:   1243841699
Pages:   168
Publication Date:   01 September 2011
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Temporarily unavailable   Availability explained
The supplier advises that this item is temporarily unavailable. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out to you.

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