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OverviewFull Product DetailsAuthor: Arief Suriadi BudimanPublisher: Springer Verlag, Singapore Imprint: Springer Verlag, Singapore Edition: 2015 ed. Dimensions: Width: 15.50cm , Height: 0.70cm , Length: 23.50cm Weight: 2.058kg ISBN: 9789812873347ISBN 10: 9812873341 Pages: 118 Publication Date: 16 January 2015 Audience: College/higher education , Postgraduate, Research & Scholarly Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsFrom the Contents: Introduction.- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab.- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.ReviewsAuthor InformationDr. Arief Suriadi Budiman received his Ph.D. in Materials Science and Engineering from Stanford University, CA. Before deciding to pursue his doctoral career, he first embarked on his technical career with Hewlett-Packard, Co in Singapore researching and developing microfabrication processes for HP’s latest generation of inkjet print head MEMS chip. During his doctoral candidacy at Stanford’s Department of Materials Science & Engineering under the supervision of Professor William D. Nix (MRS Von Hippel Award 2007), Dr. Budiman received several research awards (MRS Graduate Silver Award 2006, MRS Best Paper 2006) and contributed to several journal publications. Most recently Dr. Budiman has been awarded the prestigious Los Alamos National Laboratory (LANL) Director's Research Fellowship to conduct top strategic research for the energy and national security missions of the Los Alamos National Laboratory's. At the Center for Integrated Nanotechnologies (CINT) at Los Alamos, Dr. Budiman’s research program involves nanoscale multilayered composite materials for extreme environments with potential applications in advanced energy systems including for next generation nuclear power reactors. Tab Content 6Author Website:Countries AvailableAll regions |