|
![]() |
|||
|
||||
OverviewFull Product DetailsAuthor: Mauro SardelaPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of the original 1st ed. 2014 Dimensions: Width: 15.50cm , Height: 1.30cm , Length: 23.50cm Weight: 0.519kg ISBN: 9781493942985ISBN 10: 1493942980 Pages: 237 Publication Date: 03 September 2016 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationMauro Sardela (editor) is a Senior Research Scientist and Manager of the X-Ray Analysis Laboratory at the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Dr. Sardela received his PhD in Material Science, in 1994, from the Institute of Physics of Materials, Linköping University, Sweden. He has authored and co-authored several publications in the area of x-ray scattering, materials analysis in general, with focus on semiconductors, complex oxides, nanomaterials, etc. Judith E. Baker was a Senior Research Scientist at the Frederick Seitz Materials Research Laboratory, University of Illinois. She began working with SIMS in the early 1970's and continued until she retired in 2003. Her collaborative efforts with researchers at the University of Illinois, other universities, and National Laboratories resulted in co-authorship of over 90 reviewed journal publications. Most of the publications include SIMS applications and involve a wide variety of materials. Richard T. Haasch is a Senior Research Scientist and leader of the electron spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in analytical chemistry from the University of Minnesota in 1990. He has authored or co-authored over 90 publications and presentations in the area of surface analysis, materials characterization, and materials chemistry. Julio A.N.T. Soares is a Senior Research Scientist and manager of the Laser and Spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in Solid State Physics from the University of Sao Paulo, Brazil, in 1997. He has authored or co-authored several publications and presentations in the area of opticalcharacterization of materials. Jianguo Wen is a Materials Scientist at Electron Microscopy Center, Argonne National Laboratory. He received his Ph.D. in condensed matter physics from Institute of Physics, Chinese Academy of Sciences in 1991. He is author or co-author of over 200 publications in peer-reviewed journals in the area of transmission electron microscopy, complex oxides, nanomaterials, Li-ion batteries, superconductors, and semiconductors. With total number of citations over 6500, 15 papers were cited over 100 times. Tab Content 6Author Website:Countries AvailableAll regions |