Practical Guide to Machine Vision Software

Author:   Kye-Si Kwon ,  Steven Ready
Publisher:   Wiley-Vch
ISBN:  

9781322334035


Pages:   293
Publication Date:   01 January 2014
Format:   Electronic book text
Availability:   Available To Order   Availability explained
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Practical Guide to Machine Vision Software


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Author:   Kye-Si Kwon ,  Steven Ready
Publisher:   Wiley-Vch
Imprint:   Wiley-Vch
ISBN:  

9781322334035


ISBN 10:   132233403
Pages:   293
Publication Date:   01 January 2014
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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Kye-Si Kwon is an associate professor at Soonchunhyang University in Korea in the department of mechanical engineering. After his PhD, obtained from KAIST, Korea, in 1999, he was a member of research staffs in companies such as Samsung and LG electronics. He joined Soonchunhyang University in 2006 where his teaching and research is centered on inkjet-related measurement methods and system developments. In 2012, he spent one year at Palo Alto Research Center (PARC) in Palo Alto, California, as a visiting researcher. He also established a start-up company and is CEO of PS. Co. Ltd (www.psolution.kr). Steven Ready joined the Palo Alto Research Center more than two decades ago, where he designed and developed several high-accuracy inkjet printers for printed organic electronics and documents; studied the role of hydrogen in amorphous, polycrystalline, and crystalline silicon and associated applications; and contributed to the development of large-area amorphous and polycrystalline silicon arrays for optical and x-ray imaging, displays, and organic semiconductor materials and devices. Steven Ready has also made significant contributions to developing laser crystallization of silicon thin films; a fragile book scanner; control software for MOCVD reactors; and a scanning tunneling microscope. He is a member of the SPIE, MRS, and IS&T professional societies. He obtained his degree in Physics from the University of California at Santa Cruz.

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