Practical Electron Microscopy Of Lattice Defects
Author:   Hiroyasu Saka (Nagoya Univ, Japan & Aichi Inst Of Technology, Japan)
Publisher:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789811234699


Pages:   308
Publication Date:   26 April 2021
Format:   Hardback
Availability:   In Print   Availability explained
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Practical Electron Microscopy Of Lattice Defects


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Overview

'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

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Author:   Hiroyasu Saka (Nagoya Univ, Japan & Aichi Inst Of Technology, Japan)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789811234699


ISBN 10:   9811234698
Pages:   308
Publication Date:   26 April 2021
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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