Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Author:   Nicola Nicolici ,  Bashir M. Al-Hashimi
Publisher:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2003
Volume:   22B
ISBN:  

9781441953155


Pages:   178
Publication Date:   09 December 2010
Format:   Paperback
Availability:   Out of stock   Availability explained
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard


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Author:   Nicola Nicolici ,  Bashir M. Al-Hashimi
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2003
Volume:   22B
Dimensions:   Width: 15.50cm , Height: 1.00cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9781441953155


ISBN 10:   1441953159
Pages:   178
Publication Date:   09 December 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Design and Test of Digital Integrated Circuits.- Power Dissipation During Test.- Approaches to Handle Test Power.- Power Minimization Based on Best Primary Input Change Time.- Test Power Minimization Using Multiple Scan Chains.- Power-conscious Test Synthesis and Scheduling.- Power Profile Manipulation.- Conclusion.

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