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OverviewProviding an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices. Full Product DetailsAuthor: Vladislav A Vashchenko , V F SinkevitchPublisher: Springer Imprint: Springer Edition: illustrated edition Volume: 20 Dimensions: Width: 23.40cm , Height: 1.80cm , Length: 15.60cm Weight: 0.485kg ISBN: 9780387520834ISBN 10: 038752083 Pages: 348 Publication Date: 12 August 2008 Audience: General/trade , General Format: Undefined Publisher's Status: Unknown Availability: Out of stock Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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