Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
Author:   R.F. Egerton
Publisher:   Springer International Publishing AG
Edition:   2nd ed. 2016
ISBN:  

9783319398761


Pages:   196
Publication Date:   07 July 2016
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM


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Author:   R.F. Egerton
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   2nd ed. 2016
Dimensions:   Width: 15.50cm , Height: 1.30cm , Length: 23.50cm
Weight:   0.553kg
ISBN:  

9783319398761


ISBN 10:   3319398768
Pages:   196
Publication Date:   07 July 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy. Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.

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