|
![]() |
|||
|
||||
OverviewFull Product DetailsAuthor: Vladislav A. Vashchenko , V. F. SinkevitchPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 1st ed. Softcover of orig. ed. 2008 Dimensions: Width: 15.50cm , Height: 1.80cm , Length: 23.50cm Weight: 0.528kg ISBN: 9781441945051ISBN 10: 1441945059 Pages: 330 Publication Date: 27 October 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsFailures of Semiconductor Device.- Theoretical Basis of Current Instability in Transistor Structures.- Thermal Instability Mechanism.- Isothermal Current Instability in Silicon BJT and MOSFETs.- Isothermal Instability in Compound Semiconductor Devices.- Degradation Instabilities.- Conductivity Modulation in ESD devices.- Physical Approach to Reliability.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |