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OverviewFull Product DetailsAuthor: Richard O. Duda (San Jose State University, California) , Peter E. Hart (Ricoh Innovations) , David G. Stork (Ricoh Corporation) , David G. StorkPublisher: John Wiley & Sons Inc Imprint: Wiley-Interscience Edition: 2nd edition Dimensions: Width: 18.50cm , Height: 3.80cm , Length: 25.70cm Weight: 1.225kg ISBN: 9780471056690ISBN 10: 0471056693 Pages: 688 Publication Date: 21 November 2000 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Replaced By: 9781118456682 Format: Hardback Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviews...it provides a good introduction to the subject of Pattern Classification. (Journal of Classification, September 2007) ...a fantastic book! The presentation...could not be better, and I recommend that future authors consider...this book as a role model. (Journal of Statistical Computation and Simulation, March 2006) ...strongly recommended both as a professional reference and as a text for students... (Technometrics, February 2002) ...provides information needed to choose the most appropriate of the many available technique for a given class of problems. (SciTech Book News, Vol. 25, No. 2, June 2001) I do not believe anybody wishing to teach or do serious work on Pattern Recognition can ignore this book, as it is the sort of book one wishes to find the time to read from cover to cover! (Pattern Analysis & Applications Journal, 2001) This book is the unique text/professional reference for any serious student or worker in the field of pattern recognition. (Mathematical Reviews, Issue 2001k) ...gives a systematic overview about the major topics in pattern recognition, based whenever possible on fundamental principles. (Zentralblatt MATH, Vol. 968, 2001/18) attractively presented and readable (Journal of Classification, Vol.18, No.2 2001) .. .it provides a good introduction to the subject of Pattern Classification. ( Journal of Classification, September 2007)<p>.. .a fantastic book! The presentation...could not be better, and I recommend that future authors consider...this book as a role model. ( Journal of Statistical Computation and Simulation, March 2006)<p>.. .strongly recommended both as a professional reference and as a text for students... ( Technometrics, February 2002)<p>.. .provides information needed to choose the most appropriate of the many available technique for a given class of problems. ( SciTech Book News, Vol. 25, No. 2, June 2001)<p> I do not believe anybody wishing to teach or do serious work on Pattern Recognition can ignore this book, as it is the sort of book one wishes to find the time to read from cover to cover! ( Pattern Analysis & Applications Journal, 2001)<p> This book is the unique text/professional reference for any serious student or worker in the field of pattern recognition. …it provides a good introduction to the subject of Pattern Classification. ( Journal of Classification, September 2007) <p> …a fantastic book! The presentation...could not be better, and I recommend that future authors consider…this book as a role model. ( Journal of Statistical Computation and Simulation, March 2006) <p> .. .strongly recommended both as a professional reference and as a text for students... ( Technometrics, February 2002) <p> .. .provides information needed to choose the most appropriate of the many available technique for a given class of problems. ( SciTech Book News, Vol. 25, No. 2, June 2001) <p> I do not believe anybody wishing to teach or do serious work on Pattern Recognition can ignore this book, as it is the sort of book one wishes to find the time to read from cover to cover! ( Pattern Analysis & Applications Journal, 2001) <p> This book is the unique text/professional reference for any serious student or worker in the fie Author InformationRICHARD O. DUDA, PhD, is Professor in the Electrical Engineering Department at San Jose State University, San Jose, California. PETER E. HART, PhD, is Chief Executive Officer and President of Ricoh Innovations, Inc. in Menlo Park, California. DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations, Inc. Tab Content 6Author Website:Countries AvailableAll regions |