Particle Characterization: Light Scattering Methods

Author:   Renliang Xu
Publisher:   Springer
Edition:   2000 ed.
Volume:   13
ISBN:  

9780792363002


Pages:   399
Publication Date:   31 May 2000
Format:   Hardback
Availability:   In Print   Availability explained
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Particle Characterization: Light Scattering Methods


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Author:   Renliang Xu
Publisher:   Springer
Imprint:   Springer
Edition:   2000 ed.
Volume:   13
Dimensions:   Width: 15.60cm , Height: 2.30cm , Length: 23.40cm
Weight:   1.700kg
ISBN:  

9780792363002


ISBN 10:   0792363000
Pages:   399
Publication Date:   31 May 2000
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Preface. Acknowledgements. 1. Particle Characterization - An Overview. 2. Light Scattering - The Background Information. 3. Laser Diffraction - Sizing from Nanometers to Millimeters. 4. Optical Particle Counting - Counting and Sizing. 5. Photon Correlation Spectroscopy - Submicron Particle Characterization. 6. Electrophoretic Light Scattering - Zeta Potential Measurement. Appendices. Author Index. Subject Index.

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