Particle Characterization: Light Scattering Methods

Author:   Renliang Xu
Publisher:   Springer
Edition:   2000 ed.
Volume:   13
ISBN:  

9780792363002


Pages:   399
Publication Date:   31 May 2000
Format:   Hardback
Availability:   In Print   Availability explained
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Particle Characterization: Light Scattering Methods


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Overview

Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This text systematically describes one major branch of modern particle characterization technology - the light scattering methods. It takes the form of a monograph covering the principles, instrumentation, data interpretation, applications, and modern experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 references are provided. The title should be useful for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.

Full Product Details

Author:   Renliang Xu
Publisher:   Springer
Imprint:   Springer
Edition:   2000 ed.
Volume:   13
Dimensions:   Width: 15.60cm , Height: 2.30cm , Length: 23.40cm
Weight:   1.700kg
ISBN:  

9780792363002


ISBN 10:   0792363000
Pages:   399
Publication Date:   31 May 2000
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Preface. Acknowledgements. 1. Particle Characterization - An Overview. 2. Light Scattering - The Background Information. 3. Laser Diffraction - Sizing from Nanometers to Millimeters. 4. Optical Particle Counting - Counting and Sizing. 5. Photon Correlation Spectroscopy - Submicron Particle Characterization. 6. Electrophoretic Light Scattering - Zeta Potential Measurement. Appendices. Author Index. Subject Index.

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