|
![]() |
|||
|
||||
OverviewParticle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This text systematically describes one major branch of modern particle characterization technology - the light scattering methods. It takes the form of a monograph covering the principles, instrumentation, data interpretation, applications, and modern experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 references are provided. The title should be useful for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields. Full Product DetailsAuthor: Renliang XuPublisher: Springer Imprint: Springer Edition: 2000 ed. Volume: 13 Dimensions: Width: 15.60cm , Height: 2.30cm , Length: 23.40cm Weight: 1.700kg ISBN: 9780792363002ISBN 10: 0792363000 Pages: 399 Publication Date: 31 May 2000 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsPreface. Acknowledgements. 1. Particle Characterization - An Overview. 2. Light Scattering - The Background Information. 3. Laser Diffraction - Sizing from Nanometers to Millimeters. 4. Optical Particle Counting - Counting and Sizing. 5. Photon Correlation Spectroscopy - Submicron Particle Characterization. 6. Electrophoretic Light Scattering - Zeta Potential Measurement. Appendices. Author Index. Subject Index.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |