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OverviewFull Product DetailsAuthor: Renliang XuPublisher: Springer Imprint: Springer Edition: 2000 ed. Volume: 13 Dimensions: Width: 15.60cm , Height: 2.30cm , Length: 23.40cm Weight: 1.700kg ISBN: 9780792363002ISBN 10: 0792363000 Pages: 399 Publication Date: 31 May 2000 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsPreface. Acknowledgements. 1. Particle Characterization - An Overview. 2. Light Scattering - The Background Information. 3. Laser Diffraction - Sizing from Nanometers to Millimeters. 4. Optical Particle Counting - Counting and Sizing. 5. Photon Correlation Spectroscopy - Submicron Particle Characterization. 6. Electrophoretic Light Scattering - Zeta Potential Measurement. Appendices. Author Index. Subject Index.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |