Particle Characterization: Light Scattering Methods

Author:   Renliang Xu
Publisher:   Springer-Verlag New York Inc.
Edition:   2000 ed.
Volume:   13
ISBN:  

9781402003578


Pages:   399
Publication Date:   30 November 2001
Format:   Paperback
Availability:   Out of print, replaced by POD   Availability explained
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Particle Characterization: Light Scattering Methods


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Overview

Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.

Full Product Details

Author:   Renliang Xu
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2000 ed.
Volume:   13
Dimensions:   Width: 15.50cm , Height: 2.10cm , Length: 23.50cm
Weight:   1.290kg
ISBN:  

9781402003578


ISBN 10:   1402003579
Pages:   399
Publication Date:   30 November 2001
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of print, replaced by POD   Availability explained
We will order this item for you from a manufatured on demand supplier.

Table of Contents

Particle Characterization.- Light Scattering.- Laser Diffraction.- Optical Particle Counting.- Photon Correlation Spectroscopy.- Electrophoretic Light Scattering.

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