Outlier Analysis

Author:   Charu C. Aggarwal
Publisher:   Springer International Publishing AG
Edition:   2nd ed. 2017
ISBN:  

9783319475776


Pages:   466
Publication Date:   22 December 2016
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Outlier Analysis


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Full Product Details

Author:   Charu C. Aggarwal
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   2nd ed. 2017
Dimensions:   Width: 17.80cm , Height: 2.70cm , Length: 25.40cm
Weight:   1.473kg
ISBN:  

9783319475776


ISBN 10:   3319475770
Pages:   466
Publication Date:   22 December 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Reviews

This book presents an extensive coverage on outlier analysis from data mining and computer science perspective. Each chapter includes a detailed coverage of the topics, case studies, extensive bibliographic notes, a number of exercises, and the future direction of research in this field. The book is a good source for researchers also could be used as textbook in the related discipline. (Morteza Marzjarani, Technometrics, Vol. 60 (2), 2018)


Author Information

Charu C. Aggarwal is a Distinguished Research Staff Member (DRSM) at the IBM T. J. Watson Research Center in Yorktown Heights, New York. He completed his undergraduate degree in Computer Science from the Indian Institute of Technology at Kanpur in 1993 and his Ph.D. in Operations Research from the Massachusetts Institute of Technology in 1996. He has published more than 300 papers in refereed conferences and journals, and has applied for or been granted more than 80 patents. He is author or editor of 15 books, including textbooks on data mining, recommender systems, and outlier analysis. Because of the commercial value of his patents, he has thrice been designated a Master Inventor at IBM. He has received several internal and external awards, including the EDBT Test-of-Time Award (2014) and the IEEE ICDM Research Contributions Award (2015). He has also served as program or general chair of many major conferences in data mining. He is a fellow of the SIAM, ACM, and the IEEE, for “contributions to knowledge discovery and data mining algorithms.”

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