Overview

This volume deals with the fundamentals of and the recent developments and applications of near-field optical microscopy, giving basic accounts of how and under what circumstances superresolution beyond the half-wavelength Rayleigh limit is achieved. Interferometric and fluorescence techniques are also described, leading to molecular and even atomic resolution using light. The storage of optical information at this level of resolution is also addressed.

Full Product Details

Author:   M. Nieto-vesperinas ,  N. García
Publisher:   Springer
Imprint:   Springer
Edition:   1996 ed.
Volume:   319
Dimensions:   Width: 16.00cm , Height: 1.90cm , Length: 24.00cm
Weight:   0.692kg
ISBN:  

9780792340201

ISBN 10:   0792340205
Pages:   312
Publication Date:   30 April 1996
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Theory and Basic Principles.- Theory of Imaging in Near-Field Microscopy.- Light Scattering by Tips in Front of Surfaces.- A Numerical Study of a Model Near-Field Optical Microscope.- Short and Long Range Interactions in Near Field Optics.- Modelling Optical Resonators Probed by Subwavelength Sized Optical Detectors.- Experiments: Fundamentals and Applications.- Instrumentation in Near Field Optics.- Effect of the Coherence in Near Field Microscopy.- Scanning Interferometric Apertureless Microscopy at Ten Angstrom Resolution.- Primary Imaging Modes in Near-Field Microscopy.- Local Excitation of Surface Plasmons by TNOM.- Weak Localization of Surface Plasmon Polaritons: Direct Observation with Photon Scanning Tunneling Microscope.- STM-Induced Photon Emission from Au (110).- Writing of Nanolines on a Ferroelectric Surface with a Scanning Near-Field Optical Microscope.- Near Field Optics with High-Q Whispering-Gallery Modes.- Fluorescence Microscopy and Spectroscopy by Scanning Near-Field Optical/Atomic Force Microscope (SNOM-AFM).- Fluorescence Lifetime Contrast Combined with Probe Microscopy.- Towards SNIM: Scanning Near-Field Microscopy in the Infrared.- 6 NM Lateral Resolution in Scanning Near Field Optical Microscopy with the Tetrahedral Tip.- An Aperture-Type Reflection-Mode SNOM.- Surface Modifications Via Photo-Chemistry in a Reflection Scanning Near-Field Optical Microscope.- Near-Field Diffraction Microscopy with a Coherent Low-Energy e-Beam: Fresnel Projection Microscope.- Author Index.

Reviews

This book is essential reading not only for specialists in the field, but for newcomers. It sets out basics on which we can build. I recommend it very highly indeed.' L. Grosser in Optik, 106: 1 (1997)

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