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OverviewFull Product DetailsAuthor: Nicolae TomozeiuPublisher: Nova Science Publishers Inc Imprint: Nova Science Publishers Inc Weight: 0.432kg ISBN: 9781633211971ISBN 10: 1633211975 Pages: 143 Publication Date: 01 September 2014 Audience: General/trade , General Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsPrefaceChapter 1. Optical Emission Spectroscopy used to investigate plasma deposition of Thin Solid Films (Nicolae Tomozeiu, Oce Technologies, The Netherlands)Chapter 2. Reflectance Spectroscopy(Maria Gabriela Lagorio, INQUIMAE/Dpto. de Quimica Inorganica, Analitica y Quimica Fisica, Facultad de Ciencias Exactas y Naturales. Universidad de Buenos Aires, Argentina)Chapter 3. Photoreflectance Spectroscopy of Franz-Keldysh Oscilatons from Semiconductor Heterostructures for Electronic and Optoelectrnic Devices and Components(Hideo Takeuchi, Department of Applied Physics, Graduate School of Engineering, Osaka City University, Japan)For Complete Description and Table of Contents, please visit our website athttps://www.novapublishers.com/catalog/product_info.php?products_id=50290ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |