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OverviewNew material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera. Full Product DetailsAuthor: Kjell J. Gåsvik (Spectra Vision AS, Trondheim, Norway)Publisher: John Wiley & Sons Inc Imprint: John Wiley & Sons Inc Edition: 3rd edition Dimensions: Width: 17.60cm , Height: 3.00cm , Length: 24.90cm Weight: 0.851kg ISBN: 9780470843000ISBN 10: 0470843004 Pages: 392 Publication Date: 29 August 2002 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: Out of stock The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationKjell J. Gåsvik is the author of Optical Metrology, 3rd Edition, published by Wiley. Tab Content 6Author Website:Countries AvailableAll regions |
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