Optical Methods of Measurement: Wholefield Techniques, Second Edition
Author:   Rajpal Sirohi (Austin, Texas, USA)
Publisher:   Taylor & Francis Ltd
Edition:   2nd edition
ISBN:  

9781138115491


Pages:   316
Publication Date:   14 June 2017
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Optical Methods of Measurement: Wholefield Techniques, Second Edition


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Author:   Rajpal Sirohi (Austin, Texas, USA)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Edition:   2nd edition
Weight:   0.580kg
ISBN:  

9781138115491


ISBN 10:   1138115495
Pages:   316
Publication Date:   14 June 2017
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Waves and Beams. Optical Interference. Diffraction. Phase-Evaluation Methods. Detectors and Recording Materials. Holographic Interferometry. Speckle Metrology. Photo-Elasticity. The Moiré Phenomenon. Index.

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Author Information

Rajpal S. Sirohi is currently the vice chancellor of Amity University. Prior to this, he was the vice chancellor of Barkatullah University and director of the Indian Institute of Technology Delhi. The recipient of many international awards and author of more than 400 papers, Dr. Sirohi is involved with research concerning optical metrology, optical instrumentation, holography, and speckle phenomenon.

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