Optical Characterization of Microstructures and Optoelectronic Devices Based on Wide Band Gap Semiconductors
Author:   Shijie Xu
Publisher:   Springer Verlag, Singapore
ISBN:  

9789819519279


Pages:   373
Publication Date:   03 January 2026
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Optical Characterization of Microstructures and Optoelectronic Devices Based on Wide Band Gap Semiconductors


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Author:   Shijie Xu
Publisher:   Springer Verlag, Singapore
Imprint:   Springer Verlag, Singapore
ISBN:  

9789819519279


ISBN 10:   9819519276
Pages:   373
Publication Date:   03 January 2026
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Prof. Shijie Xu is currently a distinguished professor in Department of Optical Science and Engineering, Fudan University. Before he joined Fudan University, he worked as a professor with tenure in Department of Physics, The University of Hong Kong. Prof. Xu is interested in luminescence and related phenomena, especially effects of carrier localization and many-body interactions in internal luminescence and relevant optoelectronic processes in wide band gap semiconducts and other solids. He has authored over 170 scientific articles and letters with significant impact in the fields.

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