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Author:   Marc Ehrig
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of hardcover 1st ed. 2007
Volume:   4
Dimensions:   Width: 15.50cm , Height: 1.40cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9781441941046

ISBN 10:   1441941045
Pages:   248
Publication Date:   19 November 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Awaiting stock  
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Table of Contents

Introduction and Overview: Motivation, Contribution, Overview.- Foundations: Ontology, Ontology Alignment, Further Terms, Ontology Similarity, Use Cases, Requirements.- Related Work: Theory of Alignment, Existing Alignment Approaches.- Alignment Process: General Ontology Alignment Process, Alignment Approach, Process for Related Approaches, Evaluation.- Advanced Novel Methods: Efficiency, Machine Learning, Active Alignment, Adaptive Alignment, Integrated Approach.- Tools and Applications: Basic Infrastructure, Ontology Mapping Based on Axioms, Ontology Engineering Platform, Semantic Web and Peer-to-Peer (SWAP), Semantically Enabled Knowledge Technologies (SEKT).- Next Steps: Generalization, Complex Alignments, Completeness of Alignments, Outlook.- Conclusion: Content Summary, Assessment of Contributions, Final Statements.

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