Nonlinear Transistor Model Parameter Extraction Techniques
Author:   Matthias Rudolph ,  Christian Fager (Chalmers University of Technology Chalmers University of Technology, Gothenberg) ,  David E Root
Publisher:   Not Avail
ISBN:  

9786613342355


Pages:   376
Publication Date:   31 October 2011
Format:   Electronic book text
Availability:   Available To Order   Availability explained
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Nonlinear Transistor Model Parameter Extraction Techniques


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Author:   Matthias Rudolph ,  Christian Fager (Chalmers University of Technology Chalmers University of Technology, Gothenberg) ,  David E Root
Publisher:   Not Avail
Imprint:   Not Avail
ISBN:  

9786613342355


ISBN 10:   6613342351
Pages:   376
Publication Date:   31 October 2011
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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Without accurate component models, even the most powerful circuit simulator cannot provide meaningful results. The old saying, 'Junk in-Junk out, ' summarizes the process. The textbook, Nonlinear Transistor Model Parameter Extraction Techniques, contains a wealth of theoretical and practical information. It should be read by every active RF/Microwave circuit and as well as device designer. Les Besser, Author of COMPACT and Founder of Besser Associates


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