Noncontact Atomic Force Microscopy
Author:   Seizo Morita ,  Franz J Giessibl ,  Roland Wiesendanger
Publisher:   Springer
ISBN:  

9783642014963


Pages:   420
Publication Date:   20 September 2009
Format:   Undefined
Availability:   Out of stock   Availability explained


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Noncontact Atomic Force Microscopy


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Overview

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Full Product Details

Author:   Seizo Morita ,  Franz J Giessibl ,  Roland Wiesendanger
Publisher:   Springer
Imprint:   Springer
Dimensions:   Width: 23.40cm , Height: 2.20cm , Length: 15.60cm
Weight:   0.585kg
ISBN:  

9783642014963


ISBN 10:   3642014968
Pages:   420
Publication Date:   20 September 2009
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Unknown
Availability:   Out of stock   Availability explained

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