Noncontact Atomic Force Microscopy: Volume 2
Author:   Seizo Morita ,  Franz J. Giessibl ,  Roland Wiesendanger
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   2009 ed.
ISBN:  

9783642014949


Pages:   401
Publication Date:   01 October 2009
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Noncontact Atomic Force Microscopy: Volume 2


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Overview

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Full Product Details

Author:   Seizo Morita ,  Franz J. Giessibl ,  Roland Wiesendanger
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2009 ed.
Dimensions:   Width: 15.50cm , Height: 2.50cm , Length: 23.50cm
Weight:   0.870kg
ISBN:  

9783642014949


ISBN 10:   3642014941
Pages:   401
Publication Date:   01 October 2009
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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