Noise In Physical Systems And 1/f Fluctuations: Icnf 2001, Procs Of The 16th Intl Conf

Author:   Gijs Bosman (Univ Of Florida, Usa)
Publisher:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789810246778


Pages:   848
Publication Date:   20 August 2001
Format:   Hardback
Availability:   Out of stock   Availability explained
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Noise In Physical Systems And 1/f Fluctuations: Icnf 2001, Procs Of The 16th Intl Conf


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Author:   Gijs Bosman (Univ Of Florida, Usa)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
ISBN:  

9789810246778


ISBN 10:   9810246773
Pages:   848
Publication Date:   20 August 2001
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Noise in nanoscale devices, S. Bandyopadhyay et al; 1/f voltage noise induced by magnetic flux flow in granular superconductors, O.V. Gerashchenko; low-frequency noise analysis of different types of polysilicon resistors, A. Penarier et al; low-frequency noise in CMOS transistors - an experimental and comparative study on different technologies, P. Fantini et al; modelling of current transport and 1/f noise in GaN based HBTs (H Unlu); low-frequency noise in CdSe thin film transistors, M.J. Deen and S. Rumyanstsev; NIST program on relative intensity noise standards for optical fibre sources near 1550 nm, G. Obarski; physical model of the current noise spectral density versus dark current in CdTe detectors, A. Imad et al; time and frequency study of RTS in bipolar transistors, A. Penarier et al; neural network-based adaptive processing of electrogastrogram, S. Selvan; shot noise as a test of entanglement and nonlocality of electrons in mesoscopic systems, E.V. Sukhorukov et al; the readout of time, continued fractions and 1/f noise, M. Planat and J. Cresson; longitudinal and transverse noise of hot electrons in 2DEG channels, J. Liberis et al; 1/f noise, intermittency and clustering poisson process, F. Gruneis; noise modelling for PDE-based device simulations, F. Bonani and G. Ghione; methods of slope estimation of noise power spectral density, J. Smulko; and other papers.

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