Overview

Full Product Details

Author:   Pierre Ruterana ,  Martin Albrecht ,  Jorg Neugebauer
Publisher:   Wiley-VCH Verlag GmbH
Imprint:   Wiley-VCH Verlag GmbH
Dimensions:   Width: 18.60cm , Height: 3.90cm , Length: 24.60cm
Weight:   1.478kg
ISBN:  

9783527403875

ISBN 10:   3527403876
Pages:   686
Publication Date:   08 April 2003
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   Awaiting stock  

Table of Contents

Preface.List of Contributors.PART 1: MATERIAL.1. High-Pressure Crystallization of GaN (I. Grzegory, et al.).2. Epitaxial Lateral Overgrowth of GaN (P. Gibart, et al.).3. Plasma-Assisted Molecular Beam Epitaxy of III-V Nitrides (A. Georgakilas, et al.).4. Growth of Gallium Nitride by Hydride Vapor Phase Epitaxy (A. Trassoudaine, et al.).5. Growth and Properties of InN (V. Davydov, et al.).6. Surface Structure and Adatom Kinetics of Group-III Nitrides (J. Neugebauer).PART 2: DEFECTS AND INTERFACES.7. Topological Analysis of Defects in Nitride Semiconductors (G. Dimitrakopulos, et al.).8. Extended Defects in Wurtzite GaN Layers: Atomic Structure, Formation, and Interaction Mechanisms (P. Ruterana, et al.).9. Stain, Chemical Composition, and Defects Analysis at Atomic Level in GaN-based Epitaxial Layers (S. Kret, et al.).PART 3: PROCESSING AND DEVICES.10. Ohmic Contacts to GaN (P. Hartlieb, et al.). 11. Electroluminescent Diodes and Laser Diodes (H. Amano).12. GaN-Based Modulation-Doped FETs and Heterojunction Bipolar Transistors ( H. Morkoc & L. Liu).13. GaN-Based UV Photodetectors (F. Omnes & E. Monroy).Subject Index.

Reviews

What is different about this book from others on the same topic is that this handbook collects review articles and provides a systematic overview of the topic. It brings the latest insight into the fundamental issues with specific emphasis on growth, defect structure, and industrial applications. ( E-Streams , Vol. 7, No. 5)

Author Information

Isabella Grzegory, High Pressure Research Center, Poland Pierre Gibart, CRHEA-CNRS, France A. Georgakilas, Microelectronics Research Group, Greece Agnes Trassoudaine, Universite Blaise Pascal, France V. Yu. Davydov, Polytekhnicheskaya, Russia Jorg Neugebauer, Fritz-Haber-Institut der MPG, Germany Ph. Komninou, Aristotle University of Thessaloniki, Greece Pierre Ruterana, ESCTM-CRISMAT, France P. J. Hartlieb, North Carolina State University, Raleigh, USA H. Amano, Meijo University, Japan Hadis Morkoc, Virginia Commonwealth University, USA Franck Omnes, CRHEA/CNRS, France

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions