Overview
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Full Product Details
Author: Kenichi Shimizu ,
Tomoaki Mitani
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition: 2010 ed.
Volume: 45
Dimensions:
Width: 15.50cm
, Height: 1.50cm
, Length: 23.50cm
Weight: 0.501kg
ISBN: 9783642031595
ISBN 10: 3642031595
Pages: 182
Publication Date: 02 December 2009
Audience:
College/higher education
,
Postgraduate, Research & Scholarly
Format: Hardback
Publisher's Status: Active
Availability: Out of stock
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.
Reviews
From the reviews: The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. ... In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed. (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)
From the reviews: The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. ! In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed. (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)
From the reviews: “The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. … In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed.” (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)
