New Horizons of Applied Scanning Electron Microscopy

Author:   Kenichi Shimizu ,  Tomoaki Mitani
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   2010 ed.
Volume:   45
ISBN:  

9783642261688


Pages:   182
Publication Date:   04 May 2012
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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New Horizons of Applied Scanning Electron Microscopy


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Overview

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

Full Product Details

Author:   Kenichi Shimizu ,  Tomoaki Mitani
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2010 ed.
Volume:   45
Dimensions:   Width: 15.50cm , Height: 1.30cm , Length: 23.50cm
Weight:   0.308kg
ISBN:  

9783642261688


ISBN 10:   364226168
Pages:   182
Publication Date:   04 May 2012
Audience:   College/higher education ,  Postgraduate, Research & Scholarly
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Reviews

From the reviews: The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed. (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)


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