New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses
Author:   Alexander Hirler
Publisher:   Cuvillier
ISBN:  

9783736975200


Pages:   166
Publication Date:   15 November 2021
Format:   Paperback
Availability:   In stock   Availability explained
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New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses


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Author:   Alexander Hirler
Publisher:   Cuvillier
Imprint:   Cuvillier
Dimensions:   Width: 14.80cm , Height: 0.90cm , Length: 21.00cm
Weight:   0.204kg
ISBN:  

9783736975200


ISBN 10:   3736975201
Pages:   166
Publication Date:   15 November 2021
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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