Near-Field Optics: Theory, Instrumentation, and Applications
Author:   Michael A. Paesler (North Carolina State University, Raleigh) ,  Patrick J. Moyer (Brooklyn College of The City University of New York)
Publisher:   John Wiley & Sons Inc
ISBN:  

9780471043119


Pages:   368
Publication Date:   16 August 1996
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Near-Field Optics: Theory, Instrumentation, and Applications


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Author:   Michael A. Paesler (North Carolina State University, Raleigh) ,  Patrick J. Moyer (Brooklyn College of The City University of New York)
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-Interscience
Dimensions:   Width: 16.40cm , Height: 2.20cm , Length: 24.30cm
Weight:   0.737kg
ISBN:  

9780471043119


ISBN 10:   0471043117
Pages:   368
Publication Date:   16 August 1996
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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MICHAEL A. PAESLER is Professor of Physics at North Carolina State University. At the University's Precision Engineering Center he heads a group that exploits the near-field microscope's ability to provide spectral and temporal contrast. He has explored the optical performance and fabrication of tapered optical fibers as well as the theory of the behavior of light in the near-field. PATRICK J. MOYER is Professor of Physics at the University of North Carolina at Charlotte. A former researcher with TopoMetrix of Santa Clara, California, he was the chief scientist responsible for the design and development of the first commercially available near-field scanning optical microscope.

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