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OverviewFull Product DetailsAuthor: Bharat BhushanPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Edition: 2011 ed. Dimensions: Width: 15.50cm , Height: 3.30cm , Length: 23.50cm Weight: 0.973kg ISBN: 9783642427992ISBN 10: 3642427995 Pages: 623 Publication Date: 23 November 2014 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction - Measurement Techniques and Applications.- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes.- General and Special Probes in Scanning Microscopies.- Force Calibration Techniques for AFM Cantilevers.- Noncontact Atomic Force Microscopy and Related Topics.- Low Temperature Scanning Probe Microscopy.- Dynamic Modes of Atomic Force Microscopy.- Molecular Single Molecular Recognition Force Spectroscopy and Imaging.- Nanomechanical Properties of Solid Surfaces and Thin Films.- Computer Simulations of Nanometer-Scale Indentation and Friction.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |