Overview

Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

Full Product Details

Author:   Y. Watanabe ,  S. Heun ,  G. Salviati ,  N. Yamamoto
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2002 ed.
Volume:   588
Dimensions:   Width: 15.50cm , Height: 1.90cm , Length: 23.50cm
Weight:   0.638kg
ISBN:  

9783540433125

ISBN 10:   3540433120
Pages:   308
Publication Date:   19 July 2002
Audience:   Professional and scholarly ,  College/higher education ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Reviews

"""This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it."" (Ultramicroscopy, 99, 2004)"

This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it. (Ultramicroscopy, 99, 2004)

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