Overview

Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

Full Product Details

Author:   Y. Watanabe ,  S. Heun ,  G. Salviati ,  N. Yamamoto
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 1st ed. 2002
Volume:   588
Dimensions:   Width: 15.50cm , Height: 1.70cm , Length: 23.50cm
Weight:   0.504kg
ISBN:  

9783662143728

ISBN 10:   3662143720
Pages:   308
Publication Date:   03 October 2013
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
We will order this item for you from a manufactured on demand supplier.

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Reviews

This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it. (Ultramicroscopy, 99, 2004)

"""This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it."" (Ultramicroscopy, 99, 2004)"

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