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OverviewFabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout. Full Product DetailsAuthor: Y. Watanabe , S. Heun , G. Salviati , N. YamamotoPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Edition: Softcover reprint of the original 1st ed. 2002 Volume: 588 Dimensions: Width: 15.50cm , Height: 1.70cm , Length: 23.50cm Weight: 0.504kg ISBN: 9783662143728ISBN 10: 3662143720 Pages: 308 Publication Date: 03 October 2013 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsThis is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it. (Ultramicroscopy, 99, 2004) """This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it."" (Ultramicroscopy, 99, 2004)" Author InformationTab Content 6Author Website:Countries AvailableAll regions |