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OverviewDerived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them. Full Product DetailsAuthor: John N Dinardo , N John Dinardo (Drexel Univ.,Philadelphia,PA,USA Drexel University,Philadelphia,PA,USA Drexel University,Philadelphia,PA,USA Drexel University,Philadelphia,PA,USA)Publisher: Wiley-VCH Verlag GmbH Imprint: Wiley-VCH Verlag GmbH ISBN: 9781281842930ISBN 10: 1281842931 Pages: 173 Publication Date: 01 January 2008 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |