Nanometer Technology Designs: High-Quality Delay Tests
Author:   Nisar Ahmed ,  Nisar Ahmed
Publisher:   Springer-Verlag New York Inc.
Edition:   2008 ed.
Volume:   v. 38
ISBN:  

9780387764863


Pages:   281
Publication Date:   20 December 2007
Format:   Hardback
Availability:   Out of stock   Availability explained
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Nanometer Technology Designs: High-Quality Delay Tests


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Author:   Nisar Ahmed ,  Nisar Ahmed
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2008 ed.
Volume:   v. 38
Dimensions:   Width: 15.50cm , Height: 1.70cm , Length: 23.50cm
Weight:   0.623kg
ISBN:  

9780387764863


ISBN 10:   0387764860
Pages:   281
Publication Date:   20 December 2007
Audience:   Professional and scholarly ,  College/higher education ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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