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9781849738057

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"This text contains very well-referenced chapters on the newest advances in nanoscale imaging and microscopy and would be a welcome addition to the shelf of any research microscopist who wishes to venture beyond the conventional boundaries of these techniques. ""A very interesting and useful publication indeed, with a content according to a very high scientific standard."""

This text contains very well-referenced chapters on the newest advances in nanoscale imaging and microscopy and would be a welcome addition to the shelf of any research microscopist who wishes to venture beyond the conventional boundaries of these techniques. A very interesting and useful publication indeed, with a content according to a very high scientific standard.

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A I Kirkland is Professor of Materials at Oxford University and the author of over 170 refereed papers. He was awarded ""best materials paper"" of 2005 by the Microscopy Society of America. Since 2000 he has also been involved in the characterisation of CCD cameras for TEM. His most recent work involves the development of approaches to complex phase extension and diffractive imaging to further improve resolution.

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