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OverviewFull Product DetailsAuthor: Frank Y. Shih (New Jersey Institute of Technology, Newark, NJ, USA)Publisher: Taylor & Francis Inc Imprint: CRC Press Inc Dimensions: Width: 15.60cm , Height: 2.50cm , Length: 23.40cm Weight: 0.725kg ISBN: 9781439873311ISBN 10: 1439873313 Pages: 424 Publication Date: 25 August 2012 Audience: College/higher education , General/trade , Tertiary & Higher Education , General Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationInternationally renowned scholar Frank Y. Shih received his BS degree from the National Cheng Kung University, Taiwan, in 1980. He earned an MS degree from the State University of New York, Stony Brook, USA, in 1983, and a Ph.D from Purdue University, West Lafayette, Indiana, USA, in 1987. He is currently a professor at New Jersey Institute of Technology, Newark, jointly appointed in the departments of Computer Science, Electrical and Computer Engineering, and Biomedical Engineering. He is also director of the school’s Computer Vision Laboratory. Tab Content 6Author Website:Countries AvailableAll regions |
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