Multi-Chip Module Test Strategies
Author:   Yervant Zorian ,  V.D. Agrawal
Publisher:   Kluwer Academic Publishers
Edition:   Reprinted from JOURNAL OF ELECTRONIC TESTING, 10:1-2, 1997
Volume:   7
ISBN:  

9780792399209


Pages:   167
Publication Date:   31 May 1997
Format:   Hardback
Availability:   Out of stock   Availability explained
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Multi-Chip Module Test Strategies


Overview

Multi-chips modules (MCMs) in the late 1990s consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. This volume of research presents updated test strategies for MCMs. It is designed for engineers interested in practical implementations of MCM test solutions and for designers seeking current test and design-for-testability solutions for their next designs.

Full Product Details

Author:   Yervant Zorian ,  V.D. Agrawal
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   Reprinted from JOURNAL OF ELECTRONIC TESTING, 10:1-2, 1997
Volume:   7
Dimensions:   Width: 20.30cm , Height: 1.10cm , Length: 25.40cm
Weight:   0.576kg
ISBN:  

9780792399209


ISBN 10:   079239920
Pages:   167
Publication Date:   31 May 1997
Audience:   Professional and scholarly ,  General/trade ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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